Please join Angelina Lau, Senior Engineer at Micron Semiconductor Asia Operations, Singapore, in this two-part webinar to learn how submicron IR (O-PTIR) spectroscopy, simultaneous Raman and co-located widefield fluorescence imaging is being applied for failure analysis and organic contamination identification of small, sub-surface and complex layers and particles in microelectronics and semiconductor components.
Learn from examples such as;
- Ultra-low laser (microwatts) power analysis without damage of dark or colored samples
- Measurement of recessed defects that are inaccessible with FTIR-ATR microscopy
- Sensitivity advantages of O-PTIR over FTIR for thin film measurements
- More confident spectral library searches of unknowns with 2D simultaneous IR+Raman spectral searching
Additionally, Dr Mustafa Kansiz, Director of Product Management at Photothermal Spectroscopy Corp, will provide a brief technique overview, covering submicron simultaneous IR+Raman with co-located fluorescence widefield imaging for improved optical contrast to guide the measurement the process.
The webinar and workshop will be recorded for later on-demand viewing with opportunities to ask questions during and after the events
