Materials Science
Understand how multi-modal O-PTIR microscopy and spectroscopy provides unique chemical insights into a broad range of applications such as cultural art, geoscience, environmental and 2D materials.
Why O-PTIR for Materials Science ?
From Simultaneous SERS/SEIRA with single molecule detection to sub-micron IR resolution spectroscopy and imaging of 2D Materials, the mIRage platform offers researchers unique insights into material science applications.
- O-PTIR provides 10-30x higher IR chemical spatial resolution than FTIR but correlates to FTIR transmission and ATR-FTIR
- Non-contact, non-destructive, reflection mode measurements with FTIR transmission/ATR-like spectral quality that are library searchable
- Simultaneous O-PTIR and Raman for complimentary and confirmatory analysis with faster time to data and enhanced data confidence
- Automated measurement of defects and contaminants with featurefindIR
Single Molecule Sensitivity with Simultaneous surface enhanced IR and Raman spectroscopy
Surface enhanced infrared absorption (SEIRA) and surface enhanced Raman Spectroscopy (SERS) were simultaneously measured from the same location on plasmonically active substrates. Testing was undertaken on silver nanospheres and a gold coated atomic force microscope tip.
This approach enables an exceptional molecular sensitivity while providing complementary data from both techniques.
The plasmonic substrates tested were silver nanospheres and a gold coated atomic force microscope tip. The concurrent acquisition of SEIRA and SERS is further demonstrated by nano-sampling material onto an atomic force microscope tip.
Measurement details
- Plasmonic substrate using 40 nm colloidal Silver on BaF2
- Equimolar C60 and BPE analytes
- Dilute analyte solution applied to the surface ~27 ng/cm2
- Conventional Raman-SERS at 532 nm is measured with single molecule sensitivity
- OPTIR-SEIRA is detected with single molecule sensitivity
- The enhancement of infrared absorption is ≥104
- The 532 nm optical probe is locally enhanced ≥ 105
- The overall multiplicative enhancement for SEIRA is ≥ 109
Simultaneous sub-micron O-PTIR and Raman of graphene flakes
Top left: Visible image of graphene flake
Top right: Single wavelength IR image (1587 cm-1) showing phonon bands
Middle left: O-PTIR spectra shows the phonon mode of the graphene flake .
Middle right: Raman spectra indicate the flake is composed of multiple layers due to the presence of the shoulder at 2697 cm-1.
Bottom row: Single layer graphene flake with corresponding Raman spectra
Sub-micron O-PTIR imaging and spectroscopy of engineered IR resonant structure characterisation
Different spectral IR resonances were spectrally and spatially located with high spatial resolution (co-prop).
Data courtesy of Prof Hatice Altug, EFPL, Switzerland
Forensics: Car paint sample
Comparing Sub-micron O-PTIR and Raman spectroscopy
The paint sample provides an excellent example where O-PTIR can overcome fluorescence issues that negatively impact Raman.
The Raman spectra were collected at low power < 1 mW to minimize the effects of fluorescence, but only 1 layer provided Raman data.
O-PTIR collected excellent data of all layers.
Webinar:
Forensic paint analysis with simultaneous submicron O-PTIR and Raman micro spectroscopy
Webinars
- Material Science
Forensic paint analysis with simultaneous submicron O-PTIR and Raman micro spectroscopy
- October 21, 2020
- Material Science
Simultaneous SERS/SEIRA with single molecule detection
- April 24, 2023
- Material Science
Sub-micron IR characterization of fluid inclusions within minerals
- November 9, 2023
Need more information?
Discover how O-PTIR technology can elevate your research or help solve your toughest challenges. Our team are happy to assist and answer your questions.
