Photothermal Spectroscopy Corp. is honored to be included in the first group of companies to be selected for the CHIPS Metrology Small Business Innovation Research (SBIR) program as part of the CHIPS for America Act.
The award is made to develop a new instrument for high-speed thermal properties analysis and simultaneous chemical characterization with sub-micron spatial resolution. This project will improve thermal management and thermal property characterization for the U.S. semiconductor industry.
Congrats to our team who put forward an innovative proposal with our collaborators.
Learn more about all of the recipients of the CHIPS Metrology SBIR Award.
